Montana Patent of the Month – March 2021
Interferometry uses the optical phase of a laser to measure physical displacement of a surface. However, they are not accurate for absolute distance because of an issue called “fringe ambiguity” Fringe ambiguity refers to the repetition of every integer number of wavelengths in the phase value. In order to avoid this problem, you would need to know this integer beforehand so that the calculations can be modified correctly. These integers can be very difficult to determine though. For this reason, measuring displacement instead of absolute distance has been the classic methodology. Bridger Photonics, Inc. has designed a new method to measure distance.
Bridger Photonics focuses on providing precision LiDAR solutions to enable new capabilities and improved efficiencies. Their new distance measurement design uses two lasers with different outputs and a beam combiner. This combined beam is projected to an optical detector which determines an interference signal. Outputs are directed to reflect off of a reference surface and the desired surface. A processor then uses the signal, and each output to calculate distance based on the differences in path lengths.
Are you redesigning existing technology? Did you know your development work could be eligible for the R&D Tax Credit and you can receive up to 14% back on your expenses? Even if your development isn’t successful your work may still qualify for R&D credits (i.e. you don’t need to have a patent to qualify). To find out more, please contact a Swanson Reed R&D Specialist today or check out our free online eligibility test.
Who We Are:
Swanson Reed is one of the U.S.’ largest Specialist R&D tax advisory firms. We manage all facets of the R&D tax credit program, from claim preparation and audit compliance to claim disputes.
Swanson Reed regularly hosts free webinars and provides free IRS CE and CPE credits for CPAs. For more information please visit us at www.swansonreed.com/webinars or contact your usual Swanson Reed representative.
